Procurement Summary
Country : USA
Summary : Annual Maintenance of FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope for Benet Laboratories, Watervliet, NY
Deadline : 31 Mar 2025
Other Information
Notice Type : Tender
TOT Ref.No.: 116742715
Document Ref. No. : W911PT25Q0053
Competition : ICB
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Description
Solicitation of services to provide: annual maintenance for FEI Helios 600i Focused Ion Beam (FEB) / Scanning Electron Microscope at Benet Laboratories, Watervliet, NY per Performance Work Statement for one year.
Service Contract Labor Standards do not apply.
This is a Sole Source Procurement with FEI Company. All Responsible Proposals will be Considered.
Active Contract Opportunity
Notice ID : W911PT25Q0053
Related Notice
Department/Ind. Agency : DEPT OF DEFENSE
Sub-tier : DEPT OF THE ARMY
Major Command : AMC
Sub Command : ACC
Sub Command 2 : ACC-CTRS
Sub Command 3 : ACC WRN
Office : W6QK ACC WVA
General Information
Contract Opportunity Type: Solicitation (Original)
Original Published Date: Mar 24, 2025 08:58 am EDT
Original Date Offers Due: Mar 31, 2025 01:00 pm EDT
Inactive Policy: 15 days after date offers due
Original Inactive Date: Apr 15, 2025
Initiative: None
Classification
Original Set Aside:
Product Service Code: J036 - MAINT/REPAIR/REBUILD OF EQUIPMENT- SPECIAL INDUSTRY MACHINERY
NAICS Code: 811210 - Electronic and Precision Equipment Repair and Maintenance
Place of Performance: Watervliet, NY 12189 USA
Documents
Tender Notice
W911PT25Q0053-Solicitation.pdf