ARC3 Controller with nanoTDDB accessory Tender, USA - 113566348

Procurement Summary

Country : USA

Summary : ARC3 Controller with nanoTDDB accessory

Deadline : 03 Feb 2025

Other Information

Notice Type : Tender

TOT Ref.No.: 113566348

Document Ref. No. : NIST-SS25-CHIPS-0048

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

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Tender Details

Description

*****THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***.



BACKGROUND



The National Institute of Standards and Technology (NIST), Physics Measurement Laboratory/ 686 Division, is focused on precision measurements to support industry innovation. In particular the Applied Physics Division addresses the precise metrology for microwave and quantum photonics and nanophotonics, nanotechnology, nanoscale device and materials characterization, magnetic imaging for health applications and spintronics and its applications.

The requested equipment is for the CHIPS program funded within the quantitative nanoscale characterization group with the focus on breakdown characterization of wide bandgap semiconductor materials and advanced electronic circuits at nanoscale. This requires nanoscale measurement of local defects, interfaces, carrier density, distribution in 2D materials and breakdown voltages in wide bandgap devices within the CHIPS project and materials and devices obtained from the stakeholders.

To be able to develop such a metrology it is necessary for the equipment to have a nanoscale spatial resolution and deliver locally relatively high voltages in the range of tens to hundred volts with additional material characterization after the exposure to high DC voltages. To address the material and/or device changes the equipment must be able to detect the changes in the material properties at the same scale as the caused damage or better. One of the metrology options that can fulfill these requirements is atomic force microscopy with additional accessories. We already own the basic setup of such equipment, but to be able using the equipment with all the necessary functions it requires a special control unit. Our request is for purchase of such advanced control unit.

The requirements are:

It must be compatible with our existing MFP-3D atomic force microscope. It must have a required system firmware ...
Active Contract Opportunity
Notice ID : NIST-SS25-CHIPS-0048
Related Notice
Department/Ind. Agency : COMMERCE, DEPARTMENT OF
Sub-tier : NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office: DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Sources Sought (Updated)
Updated Published Date: Jan 21, 2025 10:11 am EST
Original Published Date: Jan 21, 2025 10:03 am EST
Updated Response Date: Feb 03, 2025 10:00 am EST
Original Response Date: Feb 03, 2025 10:00 am EST
Inactive Policy: 15 days after response date
Updated Inactive Date: Feb 18, 2025
Original Inactive Date: Feb 18, 2025
Initiative: None

Classification
Original Set Aside:

Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance: Boulder, CO 80305 USA

Documents

 Tender Notice