Procurement Summary
Country : Canada
Summary : Atomic Force Microscope
Deadline : 08 Mar 2024
Other Information
Notice Type : Tender
TOT Ref.No.: 97740788
Document Ref. No. : UOT202416975
Competition : ICB
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Notice of Intended ProcurementNAME OF PROCURING ENTITYThe Governing Council of the University of Toronto (the “University”)CONTACT PERSON AND CONTRACT PERSON COORDINATESPhilip Clements215 Huron Street, 3rd FloorToronto, ON M5S 1A2philip.clements@utoronto.caPROCUREMENT DOCUMENTSThe procurement documents are available at www.merx.com. Note that obtaining access to the procurement documents will require prospective suppliers to register and pay a registration fee. Pricing and Payment Terms are available on the MERx website.DESCRIPTION OF PROCUREMENTThe University is conducting an RFP for Atomic Force Microscope An Atomic Force Microscope (AFM) will be required for the use of several nanoelectromechanical testing modes including lateral force microscopy, force-distance mapping, magnetic force microscopy, conductive AFM, piezoresponse force microscopy, electrostatic force microscopy, and Kelvin probe microscopy.The procurement is anticipated to involve negotiation. An electronic auction is not anticipated. ADDRESS AND FINAL DATE FOR SUBMISSIONSSubmissions must be submitted electronically at https://utoronto.bonfirehub.ca/ on or before Friday, March 08, 2024 (2:00 PM local time). The submissions will not be opened publicly.CONDITIONS FOR PARTICIPATIONThe procurement is subject to the following conditions for participation:Not ApplicableAPPLICABLE TRADE AGREEMENTSThis procurement is subject to the following trade agreement(s): The Canadian Free Trade Agreement, Chapter Five The Comp...
Solicitation Type : RFP - Request for Proposal (Formal)
Reference Number : 0000265014
Location : Canada, Ontario, Toronto
Purchase Type : Duration: 1 year Option: Four years extension option
Description : Notice of Intended ProcurementNAME OF PROCURING ENTITYThe Governing Council of the University of Toronto (the “University”)CONTACT PERSON AND CONTRACT PERSON COORDINATESPhilip Clements215 Huron Street, 3rd FloorToronto, ON M5S 1A2philip.clements@utoronto.caPROCUREMENT DOCUMENTSThe procurement documents are available at www.merx.com. Note that obtaining access to the procurement documents will require prospective suppliers to register and pay a registration fee. Pricing and Payment Terms are available on the MERx website.DESCRIPTION OF PROCUREMENTThe University is conducting an RFP for Atomic Force Microscope An Atomic Force Microscope (AFM) will be required for the use of several nanoelectromechanical testing modes including lateral force microscopy, force-distance mapping, magnetic force microscopy, conductive AFM, piezoresponse force microscopy, electrostatic force microscopy, and Kelvin probe microscopy.The procurement is anticipated to involve negotiation. An electronic auction is not anticipated. ADDRESS AND FINAL DATE FOR SUBMISSIONSSubmissions must be submitted electronically at https://utoronto.bonfirehub.ca/ on or before Friday, March 08, 2024 (2:00 PM local time). The submissions will not be opened publicly.CONDITIONS FOR PARTICIPATIONThe procurem...
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Tender Notice