Benchtop Scanning Electron Microscope (Sem) Tender, Canada - 109871768

Procurement Summary

Country : Canada

Summary : Benchtop Scanning Electron Microscope (Sem)

Deadline : 22 Nov 2024

Other Information

Notice Type : Tender

TOT Ref.No.: 109871768

Document Ref. No. : 40178-10C-RFP

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

Name :Login to see tender_details

Address : Login to see tender_details

Email : Login to see tender_details

Login to see details

Tender Details

This Request for Proposals (the “RFP”) is an invitation by the University of Ottawa (the “University”) to prospective proponents to submit proposals for a Benchtop Scanning Electron Microscope (SEM), funded by the Canada Foundation for Innovation and the Ontario Research Fund.THE DELIVERABLES:The propsed equipment is a Benchtop Scanning Electron Microscope (SEM) for advanced materials characterization. High resolution imaging equipment is necessary to allow precise surface and sub-surface analysis at the nanoscale. The primary goal is to enhance research capabilities in quantum materials science and nanotechnology, leading to understanding of interface status of multi-stacked thin film (less than 100 nm), which is well aligned with objectives of Center for Hybrid Interfaces and Intelligent Thin-films (HIIT) objectives. Typical SEM provides a capability of ultra-high resolution and analytical functionalities including elemental analysis by Energy Dispersive x-ray Spectroscopy (EDS). The smaller form-factor of benchtop SEM provides further advantages of faster analysis preparation time, comparable resolution to full-size SEM, and little requirement of on-site facility preparation, such as two-stage pumping system and cooling water.SEM provides high-resolution imaging down to the nanometer scale with a flexible paltform that allows both secondary electron (SE) and backscattered electron (BSE) imaging. The system should be equipped with EDS to enable compositional analysis. The ...
Solicitation Type : RFP - Request for Proposal (Formal)
Reference Number : 0000281653
Location : Canada, Ontario, Ottawa
Delivery Point : University of Ottawa
Purchase Type : One Time Only- Delivery Date:2025/04/30
Description : This Request for Proposals (the “RFP”) is an invitation by the University of Ottawa (the “University”) to prospective proponents to submit proposals for a Benchtop Scanning Electron Microscope (SEM), funded by the Canada Foundation for Innovation and the Ontario Research Fund.THE DELIVERABLES:The propsed equipment is a Benchtop Scanning Electron Microscope (SEM) for advanced materials characterization. High resolution imaging equipment is necessary to allow precise surface and sub-surface analysis at the nanoscale. The primary goal is to enhance research capabilities in quantum materials science and nanotechnology, leading to understanding of interface status of multi-stacked thin film (less than 100 nm), which is well aligned with objectives of Center for Hybrid Interfaces and Intelligent Thin-films (HIIT) objectives. Typical SEM provides a capability of ultra-high resolution and analytical functionalities including elemental analysis by Energy Dispersive x-ray Spectroscopy (EDS). The smaller form-factor of benchtop SEM provides further advantages of faster analysis preparation time, comparable resolution to full-size SEM, and little requirement of on-site facility preparation, such as two-stage pumping system and cooling wate...

Documents

 Tender Notice