CHIPS Low Loss Mirrors - Combined Sources Sought/Notice of Intent to Sole Source Tender

Procurement Summary

Country : USA

Summary : CHIPS Low Loss Mirrors - Combined Sources Sought/Notice of Intent to Sole Source

Deadline : 17 Mar 2025

Other Information

Notice Type : Tender

TOT Ref.No.: 115696172

Document Ref. No. : NIST-SS25-CHIPS-0071

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

Name :Login to see tender_details

Address : Login to see tender_details

Email : Login to see tender_details

Login to see details

Tender Details

Description

***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***

The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Thorlabs, Inc (43 Sparta Avenue, Newton, NJ 07860) under the authority of FAR 13.106-1(b). The North American Industry Classification System (NAICS) code for this acquisition is 334413.

NIST has a need for ten (10) Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coating that meets or exceeds the following requirements.

NIST-s CHIPS Metrology Program includes research in Grand Challenge 1, Metrology for Materials Purity, Properties and Provenance. To address this Grand Challenge, the project Optical Impurity Analysis of Semiconductor Gases for Enhanced Quality Systems seeks to purchase Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings to perform ultrasensitive cavity ring-down and cavity-enhanced spectroscopy on gas-phase samples. The project is led by the Chemical Science Division of the NIST Material Measurement Laboratory, the nation-s premier metrology laboratory for measurement science, standards, technology, and data in the area of chemical sciences.

To improve sensitivity in laser absorption spectroscopy, optical cavities are used to enhance the interaction pathlength between a laser source and a gas-phase sample. Here we aim to detect trace impurities in gas-phase samples relevant to the semiconductor industry. Therefore, we require high reflectivity mirrors with low absorption and scattering loss that efficiently transmit and store laser light. The overall goal is the trace detection of small molecules like nitrous oxide (N2O) and carbon monoxide (CO) in bulk zero gases like nitrogen (N2) and argon (Ar) at the parts-per-trillion level (1 part in 1012)...
Active Contract Opportunity
Notice ID : NIST-SS25-CHIPS-0071
Related Notice
Department/Ind. Agency : COMMERCE, DEPARTMENT OF
Sub-tier : NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office: DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Special Notice (Original)
Original Published Date: Mar 03, 2025 10:24 am EST
Original Response Date: Mar 17, 2025 11:00 am EDT
Inactive Policy: 15 days after response date
Original Inactive Date: Apr 01, 2025
Initiative: None

Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334413 - Semiconductor and Related Device Manufacturing

Place of Performance: Gaithersburg, MD 20899 USA

Documents

 Tender Notice