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COMMERCE, DEPARTMENT OF has floated a tender for Chips xafs and Diffraction, Silicon Drift Detector. The project location is USA and the tender is closing on 03 May 2024. The tender notice number is NIST-SS24-CHIPS-0046, while the TOT Ref Number is 100371660. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.
Procurement Summary
Country : USA
Summary : Chips xafs and Diffraction, Silicon Drift Detector
Deadline : 03 May 2024
Other Information
Notice Type : Tender
TOT Ref.No.: 100371660
Document Ref. No. : NIST-SS24-CHIPS-0046
Competition : ICB
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Description
BACKGROUND
This project involves an existing NIST Synchrotron beamline at the National Synchrotron Light Source II (NSLS-II) and an existing CRADA with IBM. It-s purpose is to improve the x-ray Absorption Spectroscopy (xAS) measurement capabilities for state of the art semiconductor samples working directly with IBM researchers stationed at NIST-s Beamline for Materials Measurement (BMM) and other researchers studying materials for information technology. The proposed detector enhancement will substantially increase sample throughput and measurement sensitivity, driving the ability to probe semiconductor device interfaces, a broader set of element/matrix combinations, and nanoscale structures in device stacks. These enhanced capabilities will become broadly available to the US Semiconductor Industry by allocation of beam time at the BMM via NIST-s Partner User Agreement with NSLS-II (DOE). This broad and rapid accessibility of the new x-ray beamline metrology will directly enhance innovation and competitiveness in the US Semiconductor Industry.
The goal of thIs contract is to deliver two new detectors at NIST-s Beamline for Materials Measurement. One is a strip detector for high-resolution x-ray Diffraction. The other is a large-area, photo-counting x-ray detector.
NIST is seeking information from sources that may be capable of providing a commercial item solution that meets or exceeds the following draft minimum specifications:
Line Item 0001:
Description: High-resolution strip detector for x-ray Diffraction
Quantity: 1
Technical Specifications 50 μm strip width, 8 mm strip height, silicon sensor 5 keV - 40 keV detection range 4.5 keV to 40 keV threshold range 1000 kHz frame rate 107 counts/second/strip counting rate sub-100 μsec readout time air cooling U.S. line voltage compatibility Line Item 0002:
Description: Large-area, photon-counting x-ray detector
Quantity: 1
Technical Specifications active are...
Active Contract Opportunity Notice ID NIST-SS24-CHIPS-0046 Related Notice Department/Ind. Agency COMMERCE, DEPARTMENT OF Sub-tier NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY Office DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Sources Sought (Original)
All Dates/Times are: (UTC-04:00) EASTERN STANDARD TIME, NEW YORK, USA
Original Published Date: Apr 19, 2024 12:39 pm EDT
Original Response Date: May 03, 2024 11:00 am EDT
Inactive Policy: 15 days after response date
Original Inactive Date: May 18, 2024
Initiative: None
Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334413 - Semiconductor and Related Device Manufacturing
Place of Performance: Upton, NY 11973 USA
Documents
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