Procurement Summary
Country : Japan
Summary : Coldcathode Field Emission Scanning Transmission Electron Microscope with Probe Aberration Correction Mechanism Equipped System
Deadline : 28 Mar 2025
Other Information
Notice Type : Tender
TOT Ref.No.: 115375734
Document Ref. No. :
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
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Coldcathode field emission scanning transmission electron microscope with probe aberration correction mechanism equipped system
Classification :
0024 Professional/Scientific & Controlling Instruments & Apparatus
Summay of Notice :
⑴ Classification of the products to be procured : 24
⑵ Nature and quantity of the products to be purchased : Cold-cathode field emission scanning transmission electron microscope with probe aberration correction mechanism equipped system
⑶ Type of the procurement : Purchase
⑷ Basic requirements of the procurement : Cold-cathode field emission scanning transmission electron microscope with probe aberration correction mechanism equipped with ①a two-axis tilt beryllium sample holder, ②a TEM mode for acquisition of bright field images, diffraction patterns, and dark field images ③EDS detectors that is liquid nitrogen free, ④an EELS measurement system capable of acquiring multiple channels simultaneously, ⑤an EBSD detector or analysis software to obtain information on crystal orientation distribution (IPF, PF, grain boundary distribution, misorientation at grain boundaries, coincidence boundary determination, etc.), ⑥an in-situ observation sample holder and a reaction gas supply system, ⑦a cold cathode filament with a warranty period of 5 years or more, ⑧a remote control system, ⑨a plasma cleaner removing contamination on the sample surface, ⑩a cooling water circulation system (chiller), ⑪appropriate anti-vibration damper that guarantees image resolution, and ⑫appropriate magnetic field canceller that guarantees image resolut...
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