Focused Ion Beam Scanning Electron Microscope System, 1 Set Tender, Japan - 115062794

Procurement Summary

Country : Japan

Summary : Focused Ion Beam Scanning Electron Microscope System, 1 Set

Deadline : 30 Mar 2025

Other Information

Notice Type : Tender

TOT Ref.No.: 115062794

Document Ref. No. :

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

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Tender Details

Focused Ion Beam - Scanning Electron Microscope System, 1 set
Classification :
0024 Professional/Scientific & Controlling Instruments & Apparatus
Summary of Notice :
Summary
(1) Nature and quantity of the products to be purchased:
Focused Ion Beam - Scanning Electron Microscope System, 1 set
(2) Location of Work or Location of Implementation
2-4-10 Aomi, Koto-ku, Tokyo
(3) Work Period or Implementation Period
November 28, 2025
(4) Language and currency used in the contracting procedure shall be Japanese and Japanese c
urrency.
(5) Time limit for the submission of application forms and relevant documents for qualification:
17:00 p.m on March 11, 2025
(6) Time limit for tender: 16:00 p.m on March 30, 2025
(7) Contact point for the notice: Yumi Tokioka, Financial Affairs Section, General affairs Depart
ment, Tokyo Metropolitan Industrial Technology Research Institute, 2-4-10 Aomi, Koto-ku, Toky
o

Documents

 Tender Notice