Procurement Summary
Country : Japan
Summary : Focused Ion Beamscanning Electron Microscope (Fibsem) System 1 Set
Deadline : 28 Apr 2025
Other Information
Notice Type : Tender
TOT Ref.No.: 117314659
Document Ref. No. :
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Focused Ion BeamScanning Electron Microscope (FIBSEM) system 1 Set
Classification :
0024 Professional/Scientific & Controlling Instruments & Apparatus
Summay of Notice :
⑴ Classification of the products to be procured : 24
⑵ Nature and quantity of the products to be purchased : Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) system 1 Set
⑶ Time limit for the submission of comments : 17 : 00 28 April, 2025
⑷ Contact point for the notice : Nakanishi Tatsuya, Procurement Section, Accounting Department, Administrative Division, Japan Advanced Institute of Science and Technology, 1-1 Asahidai Nomi-shi Ishikawa 923-1292 Japan, TEL 0761-51-1104
Documents
Tender Notice