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Integrated High-Vacuum Atomic Force Microscopy Tender, USA - 103911639

NATIONAL AERONAUTICS AND SPACE ADMINISTRATION has floated a tender for Integrated High-Vacuum Atomic Force Microscopy. The project location is USA and the tender is closing on 22 Jul 2024. The tender notice number is 80KSC024RFI0001, while the TOT Ref Number is 103911639. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.

Procurement Summary

Country : USA

Summary : Integrated High-Vacuum Atomic Force Microscopy

Deadline : 22 Jul 2024

Other Information

Notice Type : Tender

TOT Ref.No.: 103911639

Document Ref. No. : 80KSC024RFI0001

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

Name :xxxxxxxxx

Address : xxxxxxxxx

Email : xxxxxxxxx

Tender Details

Description

1. Introduction

The Electrostatics and Surface Physics Laboratory (ESPL) at the NASA Kennedy Space Center (KSC) is looking to procure an integrated high-vacuum atomic force microscopy (AFM) system. The system will be used to measure atomic-level forces of various materials, including adhesion and electrostatic forces. It will also be used to generate topographical maps of different surfaces. This system must follow the requirements as listed in Section 2. The required period of performance is described in Section 3.

2.Technical Requirements

System shall consist of flexure-guided XY scanner, AFM head, multiple sample mount, motorized XY stage, motorized Z stage, motorized focus stage, direct on-axis optics, integrated active vibration isolation, vacuum chamber, high-vacuum controller, vacuum instrument controller, vacuum pumps (dry backing pump, turbomolecular pump), control electronics, AFM software, image analysis software, vacuum manager software, computer, monitors, cabinet, and table.

System shall use coordinate frame defined by the vendor and use that coordinate frame for compliance to these requirements.

System shall be instrumented to performing AFM, Scanning probe microscopy (SPM), Electrostatic Force Microscopy (EFM), Lateral Force Microscopy (LFM), and Kelvin Probe Force Microscopy (KPFM).

System shall quantitatively measure adhesion forces on a sample.

System shall quantitatively measure surface potential and work function on a sample.

System shall enable adjustment of all software functions and settings.

System shall provide and/or enable scripting by the customer for automating data acquisition.

System shall have a Computer with Windows OS installed to interface with all measurement equipment.

System shall have a minimum 100 µm x 100 µm x 15 µm X, Y, and Z scan range, respectively.

System shall have no less than 20-bit XYZ positional accuracy.

System shall have no less than 20-bit XYZ...
Inactive Contract Opportunity Notice ID 80KSC024RFI0001 Related Notice Department/Ind. Agency NATIONAL AERONAUTICS AND SPACE ADMINISTRATION Sub-tier NATIONAL AERONAUTICS AND SPACE ADMINISTRATION Office NASA KENNEDY SPACE CENTER
General Information
Contract Opportunity Type: Sources Sought (Original)
All Dates/Times are: (UTC-04:00) EASTERN STANDARD TIME, NEW YORK, USA
Original Published Date: Jul 08, 2024 01:48 pm EDT
Original Response Date: Jul 22, 2024 12:00 pm EDT
Inactive Policy: 15 days after response date
Original Inactive Date: Aug 06, 2024
Initiative: None

Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance: Merritt Island, FL USA