Notice of Intent to Noncompetitively Acquire CHIPS LEAP 6000 xR atom probe instrument Tender

Procurement Summary

Country : USA

Summary : Notice of Intent to Noncompetitively Acquire CHIPS LEAP 6000 xR atom probe instrument

Deadline : 22 Nov 2024

Other Information

Notice Type : Tender

TOT Ref.No.: 109834877

Document Ref. No. : NIST-NOI25-CHIPS-0008

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

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Tender Details

Description

This notice is not a request for a quotation. A solicitation document will not be issued and quotations will not be requested.

This acquisition is being conducted under the authority of FAR 13.501(a) The North American Industry Classification System (NAICS) code for this acquisition is 334516.

The National Institute of Standards and Technology (NIST), Material Measurement Laboratory (MML) is involved in materials characterization efforts to support multiple projects. Materials characterization allows NIST scientists to make direct correlations between material processing, (nano)structure, and resulting properties. This work involves three-dimensional (3D) atomic imaging of nanoscale samples in an atom probe tomography (APT) instrument. An APT instrument: (1) accepts nanoscale needle-shaped specimens and specimen array coupons for analysis, (2) triggers field ion evaporation of the specimen, (3) detects the emitted ions in time and space, and (4) generates a 3-Dimensional (3D) computational reconstruction of the evaporated volume that can be used in further analysis. In this work, the APT instrument should trigger field ion evaporation with either a voltage pulse, a deep-ultraviolet (λ Consistent with NIST-s mission to perform and develop measurement science, a particular research focus of the instrument will be the development of reference materials, benchmarks, data sets, and standard practices to characterize, quantify, and ameliorate sources of measurement bias and uncertainty, thereby improving accuracy, repeatability, and reproducibility of APT measurements.



A local electrode atom probe (LEAP) tomography instrument. The APT system will be installed in the Material Measurement Laboratory (MML) at the NIST Gaithersburg campus. Consistent with NIST-s mission to perform and develop measurement science, a particular research focus of the instrument will be the development of reference materials, benchmarks, data sets, and standard pr...
Active Contract Opportunity
Notice ID : NIST-NOI25-CHIPS-0008
Related Notice : NIST-SS25-CHIPS-0008
Department/Ind. Agency : COMMERCE, DEPARTMENT OF
Sub-tier : NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office: DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Special Notice (Original)
Original Published Date: Nov 07, 2024 01:56 pm EST
Original Response Date: Nov 22, 2024 11:00 am EST
Inactive Policy: 15 days after response date
Original Inactive Date: Dec 07, 2024
Initiative: None

Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance: Gaithersburg, MD 20899 USA

Documents

 Tender Notice