Home » Tenders » Americas » USA » Notice of Intent to Sole Source, Focus Ion Beam Scanning Electron Microscope Tender

Notice of Intent to Sole Source, Focus Ion Beam Scanning Electron Microscope Tender

DEPT OF DEFENSE has floated a tender for Notice of Intent to Sole Source, Focus Ion Beam Scanning Electron Microscope. The project location is USA and the tender is closing on 20 May 2024. The tender notice number is W912HZ24N5873, while the TOT Ref Number is 101239638. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.

Procurement Summary

Country : USA

Summary : Notice of Intent to Sole Source, Focus Ion Beam Scanning Electron Microscope

Deadline : 20 May 2024

Other Information

Notice Type : Tender

TOT Ref.No.: 101239638

Document Ref. No. : W912HZ24N5873

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

Name :Login to see tender_details

Address : Login to see tender_details

Email : Login to see tender_details

Tender Details

Description

The Concrete and Materials Branch (CMB) of the U.S. Army Engineer Research and Development Center (ERDC) Geotechnical and Structures Laboratory (GSL) has a requirement to purchase a Zeiss Focused Ion Beam SEM (FIB-SEM) manufactured by Carl Zeiss Microscopy, LLC (Cage: 325W6) under NAICS Code 334516, Analytical Laboratory Instrument Manufacturing for a new FIB-SEM to perform materials characterization, and to harmonize existing research systems.

GSL-s Concrete and Materials Branch (CMB) serves as USACE-s single point of expertise in concrete and materials-related research, materials testing and in-depth materials analysis. CMB is engaged in ongoing materials research that is supplemented by scanning electron microscopy (SEM) for materials characterization. In support of this research, GSL has obtained a Talos F200x transmission electron microscopy (TEM) that requires a means to prepare samples for analysis. To provide this means, GSL must acquire a Focused Ion Beam SEM (FIB-SEM) for both materials research and for sample preparation for the Talos F200x TEM to ensure the operability of the instrument and to increase the resolution of the data obtained. The new FIB-SEM must be compatible with the existing Zeiss XRM, perform adequate sample preparation for the TEM. The instrument must be able to combine different imaging techniques to enhance quality and reliability of analysis such as correlative microscopy solutions capable of importing 3D volumetric data from uCT/XRM directly into the FIB-SEM software. The new FIB-SEM must be compatible with the existing Zeiss XRM, perform adequate sample preparation for the TEM. Purchasing another SEM from a different company would force a diversion of funding and time that would delay projects in transition to another company-s product. Only a Zeiss FIB-SEM meets the government-s requirement. While several manufacturers produce and distribute FIB-SEMs, only Zeiss can supply a FIB-SEM compatible with the ex...
Active Contract Opportunity Notice ID W912HZ24N5873 Related Notice Department/Ind. Agency DEPT OF DEFENSE Sub-tier DEPT OF THE ARMY Major Command USACE Sub Command OTHER DIVISION Office W2R2 USA ENGR R AND D CTR
General Information
Contract Opportunity Type: Special Notice (Original)
All Dates/Times are: (UTC-05:00) CENTRAL STANDARD TIME, CHICAGO, USA
Original Published Date: May 13, 2024 02:36 pm CDT
Original Response Date: May 20, 2024 01:00 pm CDT
Inactive Policy: 15 days after response date
Original Inactive Date: Jun 04, 2024
Initiative: None

Classification
Original Set Aside:
Product Service Code: 6695 - COMBINATION AND MISCELLANEOUS INSTRUMENTS
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance: