Scanning Electron Microscope Tender, USA - 116542314

Procurement Summary

Country : USA

Summary : Scanning Electron Microscope

Deadline : 26 Mar 2025

Other Information

Notice Type : Tender

TOT Ref.No.: 116542314

Document Ref. No. : SEM

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

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Tender Details

Description

SOURCES SOUGHT: THIS IS NOT A NOTICE OF REQUEST FOR QUOTATION BUT INFORMATION AND PLANNING PURPOSES ONLY! This notice does not constitute a commitment by the Government. All information submitted in response to this announcement is voluntary and the Government will not pay for information requested nor will it compensate any respondent for any cost incurred in developing information provided to the Government.

The North American Industry Classification Systems (NAICS) Code proposed is 334516. The size standard for the NAICS is 1, 000 employees.

The requirement is to provide the United States Air Force Academy (USAFA) with a Scanning Electron Microscope.

Salient Characteristics:

At a minimum, the equipment must include:

• Electron source must be Schottky-type Field Emission Gun• Resolution in High Vacuum (HV) mode must be ≤ 1.2 nm at ≥20 kV acceleration voltage. • Resolution in Low Vacuum (LV) mode must be ≤ 2.0 nm at 15-30 kV • Accelerating voltage operational range: 500 V to ≥ 30 kV. • Probe current range must include at least 100 pA to ≥300 nA, continuously adjustable. • Magnification range: o Minimum magnification ≤ 5xo Maximum magnification ≥ 1, 000, 000x• Operational modes must include both High Vacuum (HV) and Low Vacuum (LV) modes. • Chamber size and stage capabilities: o Motorized, 5-axis stage with minimum travel range: x ≥ 80 mm, Y ≥ 60 mm, Z ≥ 50 mmo Tilt capability: at least -10° to +80° continuouslyo Rotation capability: continuous 360 degrees• Automated vacuum sequencing with oil-free vacuum pumps.

Detectors:• Must include an Everhart-Thornley type Secondary Electron (SE) detector. • Must include Backscattered Electron (BSE) detector capable of live compositional and topographical imaging. • Energy Dispersive Spectroscopy (EDS) detector: o Silicon Drift Detector (SDD) with ≥ 30 mm² active areao Energy resolution ≤130 eV (Mn-Kα) • Includes all EDS software allowing elemental mapping and quantification.

Softw...
Active Contract Opportunity
Notice ID : SEM
Related Notice
Department/Ind. Agency : DEPT OF DEFENSE
Sub-tier : DEPT OF THE AIR FORCE
Major Command : U
Sub Command : S
Sub Command 2 : AIR FORCE ACADEMY
Office: FA7000 10 CONS LGC
General Information
Contract Opportunity Type: Sources Sought (Original)
Original Published Date: Mar 20, 2025 03:14 pm MDT
Original Response Date: Mar 26, 2025 02:00 pm MDT
Inactive Policy: 15 days after response date
Original Inactive Date: Apr 10, 2025
Initiative: None

Classification
Original Set Aside: Total Small Business Set-Aside (FAR 19.5)
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance: USAF Academy, CO 80840 USA

Documents

 Tender Notice