Procurement Summary
Country : USA
Summary : Scanning Electron Microscope for x-Ray Tomography
Deadline : 18 Mar 2024
Other Information
Notice Type : Tender
TOT Ref.No.: 98219118
Document Ref. No. : NIST-SS24-CHIPS-0026
Competition : ICB
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Description
NIST is seeking information from sources that may be capable of providing a solution that meets or exceeds the following draft minimum specifications and evaluation criteria. The required item is a scanning electron microscope (SEM), which will be used as part of a novel x-ray tomography instrument. Please see attached noticed for details.
Active Contract Opportunity Notice ID NIST-SS24-CHIPS-0026 Related Notice Department/Ind. Agency COMMERCE, DEPARTMENT OF Sub-tier NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY Office DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Sources Sought (Original)
All Dates/Times are: (UTC-05:00) EASTERN STANDARD TIME, NEW YORK, USA
Original Published Date: Mar 04, 2024 11:28 am EST
Original Response Date: Mar 18, 2024 11:00 am EDT
Inactive Policy: 15 days after response date
Original Inactive Date: Apr 02, 2024
Initiative: None
Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
Place of Performance: Boulder, CO 80305 USA
Documents
Tender Notice
NIST-SS24-CHIPS-0026_SourcesSought_ecolumn_v06.docx