Procurement Summary
Country : China
Summary : Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System
Deadline : 26 Feb 2024
Other Information
Notice Type : Tender
TOT Ref.No.: 96307023
Document Ref. No. : 0801-244ZJ2440387
Competition : ICB
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Project Name: Sensitive materials spherical aberration correction transmission electron microscope and focusing ion beam electron beam double beam electron microscope system
Tenders are invited for 0801-244zj2440387, Sensitive Material Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System, 1 Set, 1 Set of Spherical Aberration Correction Transmission Electron Microscope for Sensitive Materials, 1 Set of Focusing Ion Beam Electron Beam Double Beam Electron Beam Electron Microscope System, 1 Set of Atomic Scale High Temperature and High Load in-Situ Study System for Transmission Electron Microscope, 1 Set of Three-Dimensional Reconstruction Frozen Transmission Sample Rod for Transmission Electron Microscope, 1 Set of Electron Back Scattering Diffraction (Ebsd) Detector, 1 Set of Active Shock Absorber for Transmission Electron Microscope for Sensitive Materials Spherical Aberration Correction Active Shock Absorber for Focusing Ion Beam Electron Beam Double Beam Electron Microscope System
Products List:
1: Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System
Place of Implementation: Zhejiang Province, China
Beginning of Selling Bidding Documents: 2024-02-05
Ending of Selling Bidding Documents: 2024-02-18
Price of Bidding Documents: ¥500/$80
Deadline for Submitting Bids/Time of Bid Opening (Beijing Time): 2024-02-26 09:00
Documents
Tender Notice