WESTLAKE UNIVERSITY has floated a tender for Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System. The project location is China and the tender is closing on 26 Feb 2024. The tender notice number is 0801-244ZJ2440387, while the TOT Ref Number is 96307023. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.

Expired Tender

Procurement Summary

Country : China

Summary : Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System

Deadline : 26 Feb 2024

Other Information

Notice Type : Tender

TOT Ref.No.: 96307023

Document Ref. No. : 0801-244ZJ2440387

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

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Tender Details

Project Name: Sensitive materials spherical aberration correction transmission electron microscope and focusing ion beam electron beam double beam electron microscope system

Tenders are invited for 0801-244zj2440387, Sensitive Material Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System, 1 Set, 1 Set of Spherical Aberration Correction Transmission Electron Microscope for Sensitive Materials, 1 Set of Focusing Ion Beam Electron Beam Double Beam Electron Beam Electron Microscope System, 1 Set of Atomic Scale High Temperature and High Load in-Situ Study System for Transmission Electron Microscope, 1 Set of Three-Dimensional Reconstruction Frozen Transmission Sample Rod for Transmission Electron Microscope, 1 Set of Electron Back Scattering Diffraction (Ebsd) Detector, 1 Set of Active Shock Absorber for Transmission Electron Microscope for Sensitive Materials Spherical Aberration Correction Active Shock Absorber for Focusing Ion Beam Electron Beam Double Beam Electron Microscope System

Products List:
1: Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System

Place of Implementation: Zhejiang Province, China

Beginning of Selling Bidding Documents: 2024-02-05

Ending of Selling Bidding Documents: 2024-02-18

Price of Bidding Documents: ¥500/$80

Deadline for Submitting Bids/Time of Bid Opening (Beijing Time): 2024-02-26 09:00

Documents

 Tender Notice