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WESTLAKE UNIVERSITY has floated a tender for Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System(Rebidding). The project location is China and the tender is closing on 21 Jun 2024. The tender notice number is 0801-244ZJ2441319, while the TOT Ref Number is 101986370. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.
Procurement Summary
Country : China
Summary : Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System(Rebidding)
Deadline : 21 Jun 2024
Other Information
Notice Type : Tender
TOT Ref.No.: 101986370
Document Ref. No. : 0801-244ZJ2441319
Competition : ICB
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Project Name: Sensitive materials spherical aberration correction transmission electron microscope and focusing ion beam electron beam double beam electron microscope system(Rebidding)
Tenders are invited for 0801-244zj2441319, Sensitive Material Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System, 1 Set of Spherical Aberration Correction Transmission Electron Microscope for Sensitive Materials, 1 Set of Focusing Ion Beam Electron Beam Double Beam Electron Beam Electron Microscope System, 1 Set of Atomic Scale High Temperature and High Load in-Situ Study System for Transmission Electron Microscope, 1 Set of Three-Dimensional Reconstruction Frozen Transmission Sample Rod for Transmission Electron Microscope, 1 Set of Electron Back Scattering Diffraction (Ebsd) Detector, 1 Set of Active Shock Absorber for Transmission Electron Microscope for Sensitive Materials Spherical Aberration Correction Active Shock Absorber for Focusing Ion Beam Electron Beam Double Beam Electron Microscope System
Products List:
1: Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System
Place of Implementation: Zhejiang Province, China
Beginning of Selling Bidding Documents: 2024-05-31
Ending of Selling Bidding Documents: 2024-06-07
Price of Bidding Documents: ￥500/$80
Deadline for Submitting Bids/Time of Bid Opening (Beijing Time): 2024-06-21 09:00
Documents
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