Super High Resolution Darkfield Scattering-Confocal Raman Microscope Tender, USA - 108945652

Procurement Summary

Country : USA

Summary : Super High Resolution Darkfield Scattering-Confocal Raman Microscope

Deadline : 01 Nov 2024

Other Information

Notice Type : Tender

TOT Ref.No.: 108945652

Document Ref. No. : NIST-SS25-CHIPS-0007

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

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Tender Details

Description

BACKGROUND

NIST is developing measurement methodologies for detection and identification of very low concentration of nanoparticle contaminants at extremely low concentration regimes. More than 75% of particles on an integrated chip are from liquid contaminates that are introduced during the fabrication process. Currently, the main approaches for single particle (sub-20nm) counting are ICP-MS, and laser scattering. Industry is unable to measure/control baseline impurities below 1 PPT (parts per trillion, based on dissolved ions). The BIG concern is distinguishing the instrument noise from the actual particle signal. To address this measurement challenge, we also aim at understanding the factors that govern the surface deposition of such nanoparticles to develop methods for their controlled and predictable deposition. These factors include chemical interactions and physical shape of the nanofeatures on the surface of interest. In part of this effort, we will use fluorescence, Raman and dark-field optical microscopies that are powerful tools for detecting nanoparticles down to few nanometers in size. These optical methods tandem with other high-resolution and high-sensitivity surface analytical instrumentations will be used to develop novel methods for rapid particle impurity detection on a chip.



In this regard Materials Measurement Science Division (MMSD) of NIST is planning to acquire a super resolution optical microscope with unique capabilities to meet the challenges of this project. MMSD has core expertise in multiscale materials characterization, atomic and nanoscale metrology to address national priorities and support critical and emerging technologies.



For reproducible and reliable detection of single particles as well as faint nanoscale emitters on a surface, a great deal of improved sensitivity and speed is needed to detect their fluorescence, and Raman scattering emissions. As such the platform for optical microscopy mu...
Active Contract Opportunity
Notice ID : NIST-SS25-CHIPS-0007
Related Notice
Department/Ind. Agency : COMMERCE, DEPARTMENT OF
Sub-tier : NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office: DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Sources Sought (Original)
Original Published Date: Oct 18, 2024 10:24 am EDT
Original Response Date: Nov 01, 2024 11:00 am EDT
Inactive Policy: 15 days after response date
Original Inactive Date: Nov 16, 2024
Initiative: None

Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance: Gaithersburg, MD 20899 USA

Documents

 Tender Notice