Procurement Summary
Country : USA
Summary : Swept-Wavelength Spectroscopy System
Deadline : 20 Dec 2024
Other Information
Notice Type : Tender
TOT Ref.No.: 111785731
Document Ref. No. : NIST-SS25-CHIPS-0026
Competition : ICB
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Description
Title: Sources Sought Notice for Swept-Wavelength Spectroscopy System
BACKGROUND
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.
The CHIPS Metrology Program at NIST advances metrology for accelerating R&D and for developing breakthroughs that support the development of the next-generation microelectronics and ensure the competitiveness and leadership of the United States. The Microsystems and Nanotechnology Division develops micro-/nano-fabrication technologies, devices and novel measurement methods enabled by integrated microsystems.
The research work of the Microsystems and Nanotechnology Division as part of the CHIPS metrology program has a requirement for a swept wavelength spectroscopy system to help develop advanced measurement methods and test structures for integrated photonics manufacturing. The need is for a calibrated, broadly tunable swept-wavelength laser system across the telecommunication S, C, and L bands. The system must have adequate overall tuning range, spectral resolution, sweep linearity, power control, synchronized detection, and synchronized polarization control to enable complete characterization of photonic integrated circuit components such as resonators, waveguides, couplers, interferometers, and filters. The overall system will be used or spectral measurement of optical insertion loss and polarization dependent loss of the above components. In addition, the system will be used for component characterization at fixed optical wavelengths.
NIST is seeking information from ...
Active Contract Opportunity
Notice ID : NIST-SS25-CHIPS-0026
Related Notice
Department/Ind. Agency : COMMERCE, DEPARTMENT OF
Sub-tier : NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office: DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Sources Sought (Updated)
Updated Published Date: Dec 13, 2024 03:09 pm EST
Original Published Date: Nov 18, 2024 04:07 pm EST
Updated Response Date: Dec 20, 2024 04:30 pm EST
Original Response Date: Dec 02, 2024 03:30 pm EST
Inactive Policy: 15 days after response date
Updated Inactive Date: Jan 04, 2025
Original Inactive Date: Dec 17, 2024
Initiative: None
Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
Place of Performance: Gaithersburg, MD 20899 USA
Documents
Tender Notice