Video Rate Electrochemical Scanning Tunneling Microscopy Combined Sources Sought/... Tender

Procurement Summary

Country : USA

Summary : Video Rate Electrochemical Scanning Tunneling Microscopy Combined Sources Sought/ Notice of Intent to Sole Source

Deadline : 29 Jan 2025

Other Information

Notice Type : Tender

TOT Ref.No.: 113237223

Document Ref. No. : NIST-SS25-CHIPS-0045

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

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Tender Details

Description

*****THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***.



BACKGROUND



The National Institute of Standards and Technology (NIST), Materials Measurement Laboratory, Materials Science and Engineering Division (https://www.nist.gov/mml/materials-science-and-engineering-division) is on the market for a video rate electrochemical scanning tunneling microscopy. The simplest path to attain this capability is by upgrading the electronics and control system of our existing conventional electrochemical scanning tunneling microscope (ECSTM) that is presently limited to conventional slow scan rates, e.g. 36 lines per sec. The new system will intercept signals from our existing microscope and add fast x, y, z waveforms while simultaneously monitoring the response signal, such as the tunneling current, through a fast analog to digital converter. The advanced fast scan and video imaging capability are needed to study electrochemical deposition and etching processes relevant to the fabrication of advanced microelectronics chips and devices. Video rate ECSTM imaging will enable measurement of surfactant adsorbate dynamics that operate during electrochemical deposition of metals and to track how such adsorbates and their phase transitions influence morphological and microstructural evolution during metal deposition. The proposed research will help reveal how phenomena at atomistic and mesoscopic length scale impacts macroscopic outcomes. In addition to imaging the control system should off the option of having the ability to track the surface diffusion of individual molecules or adatom, a process known as atom tracking. Once integrated within our existing system the new controller and system should enable seamless transitions between slow scan imaging with our existing conventional scanner and the new high speed video rate scanning or atom tracking functions. The high-speed control system should have its own control algorithms...
Active Contract Opportunity
Notice ID : NIST-SS25-CHIPS-0045
Related Notice
Department/Ind. Agency : COMMERCE, DEPARTMENT OF
Sub-tier : NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office: DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Sources Sought (Original)
Original Published Date: Jan 15, 2025 02:52 pm EST
Original Response Date: Jan 29, 2025 11:00 am EST
Inactive Policy: 15 days after response date
Original Inactive Date: Feb 13, 2025
Initiative: None

Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance: Gaithersburg, MD 20899 USA

Documents

 Tender Notice